MT

Mitsuo Tada

EB Ebara: 19 patents #96 of 1,611Top 6%
KT Kabushiki Kaisha Toshiba: 1 patents #13,537 of 21,451Top 65%
Sharp Kabushiki Kaisha: 1 patents #6,861 of 10,731Top 65%
Overall (All Time): #221,050 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10933507 Polishing apparatus Taro Takahashi, Akira Nakamura, Hiroaki Shibue 2021-03-02
10739488 Metal detection sensor and metal detection method using same Taro Takahashi 2020-08-11
10134614 Substrate peripheral portion measuring device, and substrate peripheral portion polishing apparatus Yasunari Suto, Hirofumi Ichihara, Kenya Ito, Tamami Takahashi 2018-11-20
9632061 Eddy current sensor and polishing method Taro Takahashi 2017-04-25
9437507 Method of correcting film thickness measurement value, film thickness corrector and eddy current sensor Akira Nakamura, Hiroaki Shibue, Yasumasa Hiroo, Hiroshi Ota, Taro Takahashi 2016-09-06
8696924 Polishing apparatus and polishing method Taro Takahashi, Motohiro Niijima, Shinro Ohta, Atsushi Shigeta 2014-04-15
8657644 Eddy current sensor and polishing method and apparatus Taro Takahashi 2014-02-25
7960188 Polishing method Shinrou Ohta, Noburu Shimizu, Yoichi Kobayashi, Taro Takahashi, Eisaku Hayashi +3 more 2011-06-14
7854646 Substrate polishing apparatus and substrate polishing method Tetsuji Togawa, Koichi Fukaya, Taro Takahashi, Yasunari Suto 2010-12-21
7714572 Method of detecting characteristics of films using eddy current Hironobu Yamasaki, Yasunari Suto 2010-05-11
7670206 Substrate polishing apparatus and substrate polishing method Tetsuji Togawa, Koichi Fukaya, Taro Takahashi, Yasunari Suto 2010-03-02
7508201 Eddy current sensor Yasunari Suto 2009-03-24
7258595 Polishing apparatus Kazuo Shimizu 2007-08-21
7078894 Polishing device using eddy current sensor Hironobu Yamasaki, Yasunari Suto 2006-07-18
7046001 Frequency measuring device, polishing device using the same and eddy current sensor Hironobu Yamasaki, Yasunari Suto 2006-05-16
6935935 Measuring apparatus Yasunari Suto 2005-08-30
6746319 Measuring apparatus Yasunari Suto 2004-06-08
6517689 Plating device Akihisa Hongo, Kenichi Suzuki, Atsushi Chono, Akira Ogata, Satoshi Sendai +1 more 2003-02-11
6500317 Plating apparatus for detecting the conductivity between plating contacts on a substrate Junichiro Yoshioka, Satoshi Sendai, Atsushi Chono, Akihisa Hongo, Yoshitaka Mukaiyama +4 more 2002-12-31
4375917 Single-chip, MOS-LSI microprocessor controlled electrophotographic copying machine Shizuka Hiraike, Yukihiro Yoshida, Shintaro Hashimoto, Toshio Yamagishi 1983-03-08