SS

Stefan Schmidt

CG Carl Zeiss Smt Gmbh: 17 patents #80 of 1,189Top 7%
RS Rohde & Schwarz: 10 patents #53 of 964Top 6%
HA Huels Aktiengesellschaft: 8 patents #36 of 532Top 7%
CG Carl Zeiss Jena Gmbh: 5 patents #21 of 374Top 6%
HD Heidelberg Druckmaschinen: 4 patents #332 of 1,510Top 25%
KA Krones Ag: 3 patents #193 of 746Top 30%
SA Siemens Aktiengesellschaft: 3 patents #4,667 of 22,248Top 25%
AB Asml Netherlands B.V.: 2 patents #1,484 of 3,192Top 50%
SN Smartsky Networks: 2 patents #24 of 38Top 65%
BR Bosch Rexroth: 2 patents #31 of 242Top 15%
MA Mannesmann Rexroth Ag: 2 patents #50 of 201Top 25%
ZK Zeuna-Starker Gmbh & Co. Kg: 2 patents #4 of 23Top 20%
ET Emcon Technologies: 2 patents #12 of 47Top 30%
Robert Bosch Gmbh: 2 patents #7,316 of 19,740Top 40%
VT Varian Medical Systems Particle Therapy: 1 patents #56 of 88Top 65%
ZA Zf Friedrichshafen Ag: 1 patents #1,366 of 2,695Top 55%
IBM: 1 patents #44,794 of 70,183Top 65%
AT Ats: 1 patents #24 of 59Top 45%
BG Bsh Bosch Und Siemens Hausgeräte Gmbh: 1 patents #458 of 904Top 55%
BG Bsh Hausgeräte Gmbh: 1 patents #669 of 1,405Top 50%
DA Degussa Ag: 1 patents #925 of 2,007Top 50%
Dr. Ing. H.C. F. Porsche Ag: 1 patents #1,158 of 2,421Top 50%
EG Emcon Technologies Germany (Augsburg) Gmbh: 1 patents #4 of 24Top 20%
FT Frank'S Casing Crew And Rental Tools: 1 patents #21 of 43Top 50%
HK Henkel Ag & Co. Kgaa: 1 patents #1,145 of 2,331Top 50%
HP Huels Aktiengesellschaft - Pb15: 1 patents #1 of 11Top 10%
MA Man Truck &Bus Ag: 1 patents #82 of 263Top 35%
OS Orbisphere Laboratories Neuchatel S.A.: 1 patents #7 of 12Top 60%
PC Phoenix Contact: 1 patents #349 of 624Top 60%
UK University Of Kentucky: 1 patents #424 of 1,057Top 45%
📍 Aalen, NC: #1 of 1 inventorsTop 100%
Overall (All Time): #22,094 of 4,157,543Top 1%
81
Patents All Time

Issued Patents All Time

Showing 26–50 of 81 patents

Patent #TitleCo-InventorsDate
9877326 Measuring device and a measuring method for determining an active channel 2018-01-23
9819330 Filter for interpolated signals 2017-11-14
9719587 Hydraulic axle Gottfried Hendrix 2017-08-01
9667356 Signal generating device with integrated fading generating unit and signal generating method 2017-05-30
9632436 Optical assembly with suppression of degradation Dirk Heinrich Ehm, Markus Walter 2017-04-25
9627778 Antenna element with high gain toward the horizon Gerard James Hayes 2017-04-18
9535210 Optical hollow waveguide assembly Markus Deguenther, Vladimir Davydenko 2017-01-03
9354529 Arrangement for use in a projection exposure tool for microlithography having a reflective optical element Dirk Heinrich Ehm, Maarten Van Kampen, Vadim Yevgenyevich Banine, Erik Roelof Loopstra 2016-05-31
9294324 Signal generator and signal generation method with cyclic prefix generation 2016-03-22
9293830 Antenna element with high gain toward the horizon Gerard James Hayes 2016-03-22
9182549 Optical coupling system for two optical waveguides Clemens Wurster, Gregor Langer, Hannes Stahr 2015-11-10
9046794 Cleaning module, EUV lithography device and method for the cleaning thereof Stefan Hembacher, Dieter Kraus, Dirk Heinrich Ehm, Stefan Koehler, Almut Czap +2 more 2015-06-02
9041905 Optical arrangement, in particular in a projection exposure apparatus for EUV lithography Dirk Heinrich Ehm, Guenther Dengel 2015-05-26
8953145 Detection of contaminating substances in an EUV lithography apparatus Dieter Kraus, Dirk Heinrich Ehm 2015-02-10
8885141 EUV lithography device and method for processing an optical element Wolfgang Singer, Yim-Bun Patrick Kwan, Dirk Heinrich Ehm, Dieter Kraus, Stefan Wiesner +3 more 2014-11-11
8339576 Projection objective of a microlithographic projection exposure apparatus Ulrich Loering, Vladimir Kamenov, Dirk Heinrich Ehm, Moritz Becker, Andreas Wurmbrand 2012-12-25
8288064 Method for examining a wafer with regard to a contamination limit and EUV projection exposure system Andreas Dorsel 2012-10-16
8053746 Irradiation device Jan Timmer, Holger Goebel, Juergen Heese, Michael Schillo 2011-11-08
8054446 EUV lithography apparatus and method for determining the contamination status of an EUV-reflective optical surface Dieter Kraus, Dirk Heinrich Ehm 2011-11-08
7955767 Method for examining a wafer with regard to a contamination limit and EUV projection exposure system Andreas Dorsel 2011-06-07
7911598 Method for cleaning an EUV lithography device, method for measuring the residual gas atmosphere and the contamination and EUV lithography device Dieter Kraus, Dirk Heinrich Ehm, Thomas Stein, Harald Woelfle 2011-03-22
7881828 Bus module for connecting electrically triggered fluidic valves 2011-02-01
7812944 Array for optical evaluation of an object array 2010-10-12
D617960 Laundry appliance Andreas Böhm, Klaus Forsterling, Kemal Genc, Johannes Geyer 2010-06-15
7698887 Method and apparatus for determining local emissions loading of emissions trap Helmut Venghaus, Lee Watts, Andreas Mayr, Clive D. Telford, Marco Ranalli +4 more 2010-04-20