Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10322491 | Printed chemical mechanical polishing pad | Mahendra C. ORILALL, Kasiraman Krishnan, Rajeev Bajaj, Nag B. Patibandla, Daniel Redfield +2 more | 2019-06-18 |
| 10209613 | System and method for manufacturing planarized extreme ultraviolet lithography blank | Cara Beasley, Ralf Hofmann, Majeed A. Foad | 2019-02-19 |
| 9829805 | Vapor deposition deposited photoresist, and manufacturing and lithography systems therefor | Timothy Weidman, Barry Chin, Majeed A. Foad, Paul Deaton | 2017-11-28 |
| 9716012 | Methods of selective layer deposition | David Thompson, Huixiong Dai, Patrick M. Martin, Kadthala Ramaya Narendrnath, Robert Jan Visser +2 more | 2017-07-25 |
| 9632411 | Vapor deposition deposited photoresist, and manufacturing and lithography systems therefor | Timothy Weidman, Barry Chin, Majeed A. Foad, Paul Deaton | 2017-04-25 |
| 9411237 | Resist hardening and development processes for semiconductor device manufacturing | Peng Xie, Christopher Dennis Bencher, Huixiong Dai, Subhash Deshmukh | 2016-08-09 |
| 9354508 | Planarized extreme ultraviolet lithography blank, and manufacturing and lithography systems therefor | Cara Beasley, Ralf Hofmann, Majeed A. Foad | 2016-05-31 |
| 9317922 | Image and part recognition technology | Jason E. Meiring, C. Grant Willson | 2016-04-19 |
| 9236467 | Atomic layer deposition of hafnium or zirconium alloy films | Timothy Weidman, Paul F. Ma, Paul Deaton | 2016-01-12 |
| 8536068 | Atomic layer deposition of photoresist materials and hard mask precursors | Timothy Weidman, Paul Deaton | 2013-09-17 |
| 8465903 | Radiation patternable CVD film | Timothy Weidman, Paul Deaton, Nitin K. Ingle, Abhijit Basu Mallick, Amit Chatterjee | 2013-06-18 |
| 8017174 | Densely packed sensor arrays | Jason E. Meiring, C. Grant Willson | 2011-09-13 |
| 7901945 | Image and part recognition technology | Jason E. Meiring, C. Grant Willson | 2011-03-08 |
| 7651850 | Image and part recognition technology | Jason E. Meiring, C. Grant Willson | 2010-01-26 |