Issued Patents All Time
Showing 25 most recent of 50 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12415982 | Automated closed system for cell therapy manufacturing | Mukhles SOWWAN | 2025-09-16 |
| 12322618 | Adaptive control of variability in device performance in advanced semiconductor processes | Lior ENGEL, Dermot Cantwell | 2025-06-03 |
| 12183684 | Semiconductor device packaging methods | Mukhles SOWWAN | 2024-12-31 |
| 12094726 | Adapting electrical, mechanical, and thermal properties of package substrates | Mukhles SOWWAN, Nirmalya Maity, Omkaram Nalamasu, Gary E. Dickerson | 2024-09-17 |
| 12005446 | High throughput compact microfluidic cell counter | Mukhles SOWWAN | 2024-06-11 |
| 11781100 | All-in-one bioreactor for therapeutic cells manufacturing | Mukhles SOWWAN, Gary E. Dickerson | 2023-10-10 |
| 11728141 | Gas hub for plasma reactor | Yan Rozenzon, Kyle Tantiwong, Imad Yousif, Vladimir Knyazik, Bojenna Keating | 2023-08-15 |
| 11244811 | Plasma reactor with highly symmetrical four-fold gas injection | Yan Rozenzon, Kyle Tantiwong, Imad Yousif, Vladimir Knyazik, Bojenna Keating | 2022-02-08 |
| 11139150 | Nozzle for multi-zone gas injection assembly | Yan Rozenzon, Kyle Tantiwong, Imad Yousif, Vladimir Knyazik, Bojenna Keating | 2021-10-05 |
| 11139142 | High-resolution three-dimensional profiling of features in advanced semiconductor devices in a non-destructive manner using electron beam scanning electron microscopy | Ofer Yuli | 2021-10-05 |
| 11119051 | Particle detection for substrate processing | Todd Egan, Mehdi Vaez-Iravani, Kyle Tantiwong, Gregory L. Kirk, Abraham Ravid +1 more | 2021-09-14 |
| 10955832 | Adaptive chamber matching in advanced semiconductor process control | — | 2021-03-23 |
| 10943763 | Use of electron beam scanning electron microscopy for characterization of a sidewall occluded from line-of-sight of the electron beam | Ofer Yuli | 2021-03-09 |
| 10930531 | Adaptive control of wafer-to-wafer variability in device performance in advanced semiconductor processes | Lior ENGEL, Dermot Cantwell | 2021-02-23 |
| 10929586 | Predictive spatial digital design of experiment for advanced semiconductor process optimization and control | Dermot Cantwell, Waheb Bishara | 2021-02-23 |
| 10923371 | Metrology system for substrate deformation measurement | Mehdi Vaez-Iravani, Todd Egan, Kyle Tantiwong | 2021-02-16 |
| 10845317 | Particle detection for substrate processing | Todd Egan, Mehdi Vaez-Iravani, Kyle Tantiwong, Gregory L. Kirk, Abraham Ravid +1 more | 2020-11-24 |
| 10825708 | Process kit components for use with an extended and independent RF powered cathode substrate for extreme edge tunability | Valentin N. Todorow, Imad Yousif, Albert Wang, Gary Leray | 2020-11-03 |
| 10705514 | Adaptive chamber matching in advanced semiconductor process control | — | 2020-07-07 |
| 10657214 | Predictive spatial digital design of experiment for advanced semiconductor process optimization and control | Dermot Cantwell, Waheb Bishara | 2020-05-19 |
| 10573493 | Inductively coupled plasma apparatus | Valentin N. Todorow, Ankur Agarwal, Zhigang Chen, TSE-CHIANG WANG, Andrew Nguyen +2 more | 2020-02-25 |
| 10553398 | Power deposition control in inductively coupled plasma (ICP) reactors | Tza-Jing Gung, Vladimir Knyazik, Kyle Tantiwong, Dan Marohl, Valentin N. Todorow +1 more | 2020-02-04 |
| 10510624 | Metrology systems with multiple derivative modules for substrate stress and deformation measurement | Mehdi Vaez-Iravani, Todd Egan, Kyle Tantiwong | 2019-12-17 |
| 10422984 | Flexible mode scanning optical microscopy and inspection system | Waheb Bishara, Dong Wu, Mehdi Vaez-Iravani | 2019-09-24 |
| 10410841 | Side gas injection kit for multi-zone gas injection assembly | Yan Rozenzon, Kyle Tantiwong, Imad Yousif, Vladimir Knyazik, Bojenna Keating | 2019-09-10 |