RM

Rashid Mavliev

Applied Materials: 31 patents #353 of 7,310Top 5%
AL American Air Liquide: 1 patents #181 of 326Top 60%
NE Nevmet: 1 patents #6 of 10Top 60%
PS Particle Measuring Systems: 1 patents #41 of 64Top 65%
📍 Campbell, CA: #106 of 2,187 inventorsTop 5%
🗺 California: #10,935 of 386,348 inventorsTop 3%
Overall (All Time): #75,904 of 4,157,543Top 2%
41
Patents All Time

Issued Patents All Time

Showing 1–25 of 41 patents

Patent #TitleCo-InventorsDate
12165881 Methods and systems of forming metal interconnect layers using engineered templates 2024-12-10
11756800 Methods and systems of forming metal interconnect layers using engineered templates 2023-09-12
11125673 System and method for characterization of inclusions in liquid samples 2021-09-21
10705009 System and method for characterization of inclusions in liquid samples 2020-07-07
10241024 System and method for characterization of inclusions in liquid samples 2019-03-26
7842169 Method and apparatus for local polishing control Stan Tsai, Feng Q. Liu, Yan Wang, Liang-Yuh Chen, Alain Duboust 2010-11-30
7815787 Electrolyte retaining on a rotating platen by directional air flow Hung Chih Chen 2010-10-19
7738101 Systems and methods for in-line monitoring of particles in opaque flows 2010-06-15
7678245 Method and apparatus for electrochemical mechanical processing Yan Wang, Siew Neo, Feng Q. Liu, Stan Tsai, Yongqi Hu +9 more 2010-03-16
7670468 Contact assembly and method for electrochemical mechanical processing Feng Q. Liu 2010-03-02
7608173 Biased retaining ring Antoine P. Manens, Feng Q. Liu, Paul D. Butterfield, Alain Duboust 2009-10-27
7569134 Contacts for electrochemical processing Paul D. Butterfield, Liang-Yuh Chen, Yongqi Hu, Antoine P. Manens, Stan Tsai 2009-08-04
7520968 Conductive pad design modification for better wafer-pad contact Lakshmanan Karuppiah 2009-04-21
7513062 Single wafer dryer and drying methods Younes Achkire, Alexander Lerner, Boris Govzman, Boris Fishkin, Michael Sugarman +4 more 2009-04-07
7452264 Pad cleaning method Hung Chih Chen 2008-11-18
7427340 Conductive pad Ralph Wadensweiler 2008-09-23
7422516 Conductive polishing article for electrochemical mechanical polishing Paul D. Butterfield, Liang-Yuh Chen, Yonqi Hu, Antoine P. Manens, Stan Tsai +5 more 2008-09-09
7407433 Pad characterization tool Simon Yavelberg, Gerald Alonzo 2008-08-05
7374644 Conductive polishing article for electrochemical mechanical polishing Paul D. Butterfield, Liang-Yuh Chen, Yongqi Hu, Antoine P. Manens, Stan Tsai +2 more 2008-05-20
7375023 Method and apparatus for chemical mechanical polishing of semiconductor substrates Stan Tsai, Liang-Yuh Chen, Lizhong Sun, Shijian Li, Feng Q. Liu +2 more 2008-05-20
7344432 Conductive pad with ion exchange membrane for electrochemical mechanical polishing Liang-Yun Chen, Yuchun Wang, Yan Wang, Alain Duboust, Daniel Carl +9 more 2008-03-18
7311592 Conductive polishing article for electrochemical mechanical polishing Liang-Yuh Chen, Yuchun Wang, Yan Wang, Alain Duboust, Daniel Carl +4 more 2007-12-25
7303662 Contacts for electrochemical processing Stan Tsai, Yongqi Hu, Paul D. Butterfield, Antoine P. Manens, Liang-Yuh Chen 2007-12-04
7278911 Conductive polishing article for electrochemical mechanical polishing Paul D. Butterfield, Liang-Yuh Chen, Yonqi Hu, Antoine P. Manens, Stan Tsai +5 more 2007-10-09
7232363 Polishing solution retainer Hanzhong Zhang, Feng Q. Liu, Stan Tsai, Donald Olgado, Liang-Yuh Chen 2007-06-19