Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12398199 | Nano antibody for neutralizing toxicity of SARS-CoV-2 and preparation method and application thereof | Wenchao Zhuang, Fusheng Li, Qianhui Li, Yunxing Zhao | 2025-08-26 |
| 8343795 | Method to break and assemble solar cells | Yuhao Luo | 2013-01-01 |
| 7626874 | Method and apparatus for testing a memory device with a redundant self repair feature | Yuezhen Fan, Arnold A. Cruz | 2009-12-01 |
| 7246285 | Method of automatic fault isolation in a programmable logic device | Tarek Eldin, Feng Wang, David M. Mahoney | 2007-07-17 |
| 7227364 | Test circuit for and method of identifying a defect in an integrated circuit | Yuezhen Fan, David Mark, Eric J. Thorne | 2007-06-05 |
| 7145344 | Method and circuits for localizing defective interconnect resources in programmable logic devices | David Mark, Yuezhen Fan, Xiao-Yu Li | 2006-12-05 |
| 7020860 | Method for monitoring and improving integrated circuit fabrication using FPGAs | Joe W. Zhao, Xiao-Yu Li, Feng Wang | 2006-03-28 |
| 6950771 | Correlation of electrical test data with physical defect data | Yuezhen Fan, Jason Songbo Xu, Stephen Tang | 2005-09-27 |
| 6891395 | Application-specific testing methods for programmable logic devices | Robert W. Wells, Robert D. Patrie, Vincent L. Tong, Jae-Weon Cho, Shahin Toutounchi | 2005-05-10 |
| 6817006 | Application-specific testing methods for programmable logic devices | Robert W. Wells, Robert D. Patrie, Vincent L. Tong, Jae-Weon Cho, Shahin Toutounchi | 2004-11-09 |
| 6664808 | Method of using partially defective programmable logic devices | Jae-Weon Cho, Robert W. Wells, Clay S. Johnson, Shelly Davis | 2003-12-16 |
| 6594610 | Fault emulation testing of programmable logic devices | Shahin Toutounchi, Anthony P. Calderone, Robert D. Patrie, Eric J. Thorne, Robert W. Wells | 2003-07-15 |
| 6376131 | Methods and structures for protecting reticles from ESD failure | Jae-Weon Cho, Xin Wu | 2002-04-23 |
| 6001663 | Apparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the same | Yung-Tao Lin, Ying Shiau | 1999-12-14 |
| 5963780 | Method for detecting defect sizes in polysilicon and source-drain semiconductor devices | Yung-Tao Lin, Ying Shiau | 1999-10-05 |
| 5930138 | Arrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runs | Yung-Tao Lin, James M. Pak, Ying Shiau | 1999-07-27 |
| 5821765 | Apparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the same | Yung-Tao Lin, Ying Shiau | 1998-10-13 |
| 5761065 | Arrangement and method for detecting sequential processing effects in manufacturing | Richard Kittler, James M. Pak, Yung-Tao Lin, Ying Shiau | 1998-06-02 |
| 5716856 | Arrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runs | Yung-Tao Lin, James M. Pak, Ying Shiau | 1998-02-10 |
| 5670891 | Structures to extract defect size information of poly and source-drain semiconductor devices and method for making the same | Yung-Tao Lin, Ying Shiau | 1997-09-23 |
| 5598341 | Real-time in-line defect disposition and yield forecasting system | Thao H. T. Vo, Siu May Ho, Ying Shiau, Yeng-Kaung Peng, Yung-Tao Lin | 1997-01-28 |