| 11043484 |
Method and apparatus of package enabled ESD protection |
Hong Shi, James Karp, Siow Chek Tan, Martin L. Voogel, Mohsen H. Mardi +1 more |
2021-06-22 |
| 10838018 |
Multiple insertion testing of test socket |
Joseph M. Juane, Owais E. Malik, Mohsen H. Mardi |
2020-11-17 |
| 10665579 |
Chip package assembly with power management integrated circuit and integrated circuit die |
Stephen M. Trimberger, Mohsen H. Mardi |
2020-05-26 |
| 10564212 |
Integrated circuit package testing system |
Mohsen H. Mardi |
2020-02-18 |
| 10539610 |
Chip package test system |
Mohsen H. Mardi |
2020-01-21 |
| 10527670 |
Testing system for lid-less integrated circuit packages |
Gamal Refai-Ahmed, Ivor G. Barber, Suresh Ramalingam, Jaspreet S. Gandhi, Tien-Yu Lee +2 more |
2020-01-07 |
| 9123738 |
Transmission line via structure |
Mohsen H. Mardi |
2015-09-01 |
| 8659169 |
Corner structure for IC die |
Mohsen H. Mardi |
2014-02-25 |
| 8269516 |
High-speed contactor interconnect with circuitry |
Mohsen H. Mardi |
2012-09-18 |
| 7837481 |
Socket for an integrated circuit and a method of providing a connection in a socket |
Mohsen H. Mardi |
2010-11-23 |
| 7381908 |
Circuit board stiffener |
Cosimo Cantatore, Mohsen H. Mardi |
2008-06-03 |
| 7352197 |
Octal/quad site docking compatibility for package test handler |
Mohsen H. Mardi |
2008-04-01 |
| 7285973 |
Methods for standardizing a test head assembly |
Mohsen H. Mardi |
2007-10-23 |
| 7246285 |
Method of automatic fault isolation in a programmable logic device |
Tarek Eldin, Zhi-Min Ling, Feng Wang |
2007-07-17 |
| 7180318 |
Multi-pitch test probe assembly for testing semiconductor dies having contact pads |
Mohsen H. Mardi |
2007-02-20 |
| 7138811 |
Seals used for testing on an integrated circuit tester |
Mohsen H. Mardi |
2006-11-21 |
| 7083428 |
Hybrid interface apparatus for testing integrated circuits having both low-speed and high-speed input/output pins |
Mohsen H. Mardi |
2006-08-01 |
| 6958616 |
Hybrid interface apparatus for testing integrated circuits having both low-speed and high-speed input/output pins |
Mohsen H. Mardi |
2005-10-25 |
| 6809524 |
Testing of conducting paths using a high speed I/O test package |
Brian M. Sadler, Mohsen H. Mardi |
2004-10-26 |