Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7373538 | Method for determining interconnect line performance within an integrated circuit | Himanshu Verma, Feng Wang, Eric J. Thorne | 2008-05-13 |
| 7246285 | Method of automatic fault isolation in a programmable logic device | Zhi-Min Ling, Feng Wang, David M. Mahoney | 2007-07-17 |