Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11099169 | Dual pore—control and sensor device | Reto Stamm, Michael Summers, William B. Dunbar | 2021-08-24 |
| 9372956 | Increased usable programmable device dice | Yuezhen Fan, Xiao-Yu Li, Glenn O'Rourke, Stephen M. Trimberger | 2016-06-21 |
| 9341668 | Integrated circuit package testing | Ganesh Hariharan, Raghunandan Chaware, Glenn O'Rourke, Inderjit Singh, David E. Schweigler | 2016-05-17 |
| 7373538 | Method for determining interconnect line performance within an integrated circuit | Tarek Eldin, Himanshu Verma, Feng Wang | 2008-05-13 |
| 7227364 | Test circuit for and method of identifying a defect in an integrated circuit | Yuezhen Fan, David Mark, Zhi-Min Ling | 2007-06-05 |
| 7080300 | Testing a programmable logic device with embedded fixed logic using a scan chain | Nigel G. Herron, Qingqi Wang, Anthony Correale, Jr., Thomas Anderson Dick | 2006-07-18 |
| 6996758 | Apparatus for testing an interconnecting logic fabric | Nigel G. Herron, Qingqi Wang | 2006-02-07 |
| 6983405 | Method and apparatus for testing circuitry embedded within a field programmable gate array | Nigel G. Herron, Qingqi Wang | 2006-01-03 |
| 6651238 | Providing fault coverage of interconnect in an FPGA | Robert W. Wells, Robert D. Patrie, Michael M. Matera | 2003-11-18 |
| 6594610 | Fault emulation testing of programmable logic devices | Shahin Toutounchi, Anthony P. Calderone, Zhi-Min Ling, Robert D. Patrie, Robert W. Wells | 2003-07-15 |