David Mark — 20 Patents at AMD

David Mark has been granted 20 US patents while listed as an inventor at AMD. The first was granted in 1986 and the most recent in October 2024. David Mark ranks #214,803 of 4,157,543 US inventors in our database (top 5.2%). Patent records list David Mark in Gainsborough, CA, GB.

Patents per Year

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12131006	Global event-based avatar	Sumbul Alvi, Kimberly A. Phifer, Graham Reid, Suraj Vindana Samaranayake, Alexandre Valdetaro Porto	2024-10-29	$31,993,000
11714524	Global event-based avatar	Sumbul Alvi, Kimberly A. Phifer, Graham Reid, Suraj Vindana Samaranayake, Alexandre Valdetaro Porto	2023-08-01	$16,856,000
11010022	Global event-based avatar	Sumbul Alvi, Kimberly A. Phifer, Graham Reid, Suraj Vindana Samaranayake, Alexandre Valdetaro Porto	2021-05-18	$173,328,000
10656797	Global event-based avatar	Sumbul Alvi, Kimberly A. Phifer, Graham Reid, Suraj Vindana Samaranayake, Alexandre Valdetaro Porto	2020-05-19	$38,093,000
8000519	Method of metal pattern inspection verification	Yongjun Zheng, Joe W. Zhao, Felino E. Pagaduan	2011-08-16	$5,707,000
7453261	Method of and system for monitoring the functionality of a wafer probe site	—	2008-11-18	$2,887,000
7363560	Circuit for and method of determining the location of a defect in an integrated circuit	Yuezhen Fan	2008-04-22	$4,812,000
7262623	Method for gross I/O functional test at wafer sort	Yung-Cheng Chen, Randy J. Simmons	2007-08-28	$20,998,000
7227364	Test circuit for and method of identifying a defect in an integrated circuit	Yuezhen Fan, Eric J. Thorne, Zhi-Min Ling	2007-06-05	$7,795,000
7145344	Method and circuits for localizing defective interconnect resources in programmable logic devices	Yuezhen Fan, Zhi-Min Ling, Xiao-Yu Li	2006-12-05	$10,249,000
7124338	Methods of testing interconnect lines in programmable logic devices using partial reconfiguration	Randy J. Simmons, Huy Le, Kazi S. Afzal	2006-10-17	$13,661,000
6889368	Method and apparatus for localizing faults within a programmable logic device	Randy J. Simmons, Min Luo	2005-05-03	$34,262,000
6803912	Real time three-dimensional multiple display imaging system	Brett C. Weichers	2004-10-12
6788095	Method for gross input leakage functional test at wafer sort	Randy J. Simmons	2004-09-07	$9,185,000
D316195	Double helix bookcase	—	1991-04-16
4740220	Dust detection	Gordon Lynch, Harold Gibson, James H. Vincent	1988-04-26
4690242	Sound actuated switch	—	1987-09-01
4675034	Dust collector	Gordon Lynch, Peter McLuckie, James H. Vincent	1987-06-23
4616513	Dust collection	Harold Gibson, Gordon Lynch, James H. Vincent	1986-10-14
4586389	Dust detection	James H. Vincent, Harold Gibson, Gordon Lynch	1986-05-06

David Mark — 20 Patents

Patents per Year

Issued Patents All Time

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