DM

David Mark

AM AMD: 9 patents #1,329 of 9,279Top 15%
CL Coal Industry (Patents) Limited: 4 patents #7 of 230Top 4%
Snap: 4 patents #537 of 1,334Top 45%
MR Mark Resources: 1 patents #3 of 5Top 60%
Overall (All Time): #218,752 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12131006 Global event-based avatar Sumbul Alvi, Kimberly A. Phifer, Graham Reid, Suraj Vindana Samaranayake, Alexandre Valdetaro Porto 2024-10-29
11714524 Global event-based avatar Sumbul Alvi, Kimberly A. Phifer, Graham Reid, Suraj Vindana Samaranayake, Alexandre Valdetaro Porto 2023-08-01
11010022 Global event-based avatar Sumbul Alvi, Kimberly A. Phifer, Graham Reid, Suraj Vindana Samaranayake, Alexandre Valdetaro Porto 2021-05-18
10656797 Global event-based avatar Sumbul Alvi, Kimberly A. Phifer, Graham Reid, Suraj Vindana Samaranayake, Alexandre Valdetaro Porto 2020-05-19
8000519 Method of metal pattern inspection verification Yongjun Zheng, Joe W. Zhao, Felino E. Pagaduan 2011-08-16
7453261 Method of and system for monitoring the functionality of a wafer probe site 2008-11-18
7363560 Circuit for and method of determining the location of a defect in an integrated circuit Yuezhen Fan 2008-04-22
7262623 Method for gross I/O functional test at wafer sort Yung-Cheng Chen, Randy J. Simmons 2007-08-28
7227364 Test circuit for and method of identifying a defect in an integrated circuit Yuezhen Fan, Eric J. Thorne, Zhi-Min Ling 2007-06-05
7145344 Method and circuits for localizing defective interconnect resources in programmable logic devices Yuezhen Fan, Zhi-Min Ling, Xiao-Yu Li 2006-12-05
7124338 Methods of testing interconnect lines in programmable logic devices using partial reconfiguration Randy J. Simmons, Huy Le, Kazi S. Afzal 2006-10-17
6889368 Method and apparatus for localizing faults within a programmable logic device Randy J. Simmons, Min Luo 2005-05-03
6803912 Real time three-dimensional multiple display imaging system Brett C. Weichers 2004-10-12
6788095 Method for gross input leakage functional test at wafer sort Randy J. Simmons 2004-09-07
D316195 Double helix bookcase 1991-04-16
4740220 Dust detection Gordon Lynch, Harold Gibson, James H. Vincent 1988-04-26
4690242 Sound actuated switch 1987-09-01
4675034 Dust collector Gordon Lynch, Peter McLuckie, James H. Vincent 1987-06-23
4616513 Dust collection Harold Gibson, Gordon Lynch, James H. Vincent 1986-10-14
4586389 Dust detection James H. Vincent, Harold Gibson, Gordon Lynch 1986-05-06