HL

Huy Le

AM AMD: 1 patents #5,683 of 9,279Top 65%
SI Starion Instruments: 1 patents #8 of 10Top 80%
UW University Of Washington: 1 patents #985 of 2,234Top 45%
Overall (All Time): #1,513,815 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9528987 Reagent patterning in capillarity-based analyzers and associated systems and methods Paul Yager, Barry R. Lutz, Elain S. Fu, Gina Fridley, Peter C. Kauffman 2016-12-27
7124338 Methods of testing interconnect lines in programmable logic devices using partial reconfiguration David Mark, Randy J. Simmons, Kazi S. Afzal 2006-10-17
7025065 Method of testing thermal cautery devices Thomas H. McGaffigan, Jan Echeverry, Donielle Boudin, Peter Carlotto 2006-04-11