Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9417309 | Test structure and method for calibrating three-dimensional thermography fault isolation tool | Daisy Lu | 2016-08-16 |
| 9372956 | Increased usable programmable device dice | Eric J. Thorne, Xiao-Yu Li, Glenn O'Rourke, Stephen M. Trimberger | 2016-06-21 |
| 7673270 | Method and apparatus for compensating an integrated circuit layout for mechanical stress effects | Yan Wang, Nui Chong, Hong-Tsz Pan, Bang-Thu Nguyen, Jonathan Ho +4 more | 2010-03-02 |
| 7626874 | Method and apparatus for testing a memory device with a redundant self repair feature | Zhi-Min Ling, Arnold A. Cruz | 2009-12-01 |
| 7363560 | Circuit for and method of determining the location of a defect in an integrated circuit | David Mark | 2008-04-22 |
| 7227364 | Test circuit for and method of identifying a defect in an integrated circuit | David Mark, Eric J. Thorne, Zhi-Min Ling | 2007-06-05 |
| 7145344 | Method and circuits for localizing defective interconnect resources in programmable logic devices | David Mark, Zhi-Min Ling, Xiao-Yu Li | 2006-12-05 |
| 6950771 | Correlation of electrical test data with physical defect data | Jason Songbo Xu, Stephen Tang, Zhi-Min Ling | 2005-09-27 |