Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7626874 | Method and apparatus for testing a memory device with a redundant self repair feature | Yuezhen Fan, Zhi-Min Ling | 2009-12-01 |
| 6943581 | Test methodology for direct interconnect with multiple fan-outs | Randy J. Simmons | 2005-09-13 |