Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11668748 | Addressable test chip | Fan Lan, Weiwei Pan, Shenzhi Yang | 2023-06-06 |
| 10254339 | Addressable test chip test system | Fan Lan, Shenzhi Yang, Weiwei Pan | 2019-04-09 |
| 10156605 | Addressable ring oscillator test chip | Weiwei Pan, Yongli Liu, Xu Ouyang, Zheng Shi, Lili Li | 2018-12-18 |
| 9817058 | Addressable test circuit and test method for key parameters of transistors | Weiwei Pan | 2017-11-14 |
| 9646900 | Programmable addressable test chip | Xu Ouyang, Zheng Shi, Peiyong Zhang | 2017-05-09 |
| 9407041 | Anti-disengaging mechanism of cable connector | Jiang Lirong, Liang Chen, Jie Mo | 2016-08-02 |
| 9146270 | Method for testing a plurality of transistors in a target chip | Kangpeng Shao, Xu Ouyang | 2015-09-29 |
| 8166445 | Estimating Icc current temperature scaling factor of an integrated circuit | Cinti X. Chen, Joe W. Zhao | 2012-04-24 |
| 8000519 | Method of metal pattern inspection verification | David Mark, Joe W. Zhao, Felino E. Pagaduan | 2011-08-16 |