Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11668748 | Addressable test chip | Fan Lan, Weiwei Pan, Yongjun Zheng | 2023-06-06 |
| 11243251 | Addressable test system with address register | Fan Lan, Weiwei Pan | 2022-02-08 |
| 10254339 | Addressable test chip test system | Fan Lan, Yongjun Zheng, Weiwei Pan | 2019-04-09 |
| 9564379 | Via chains for defect localization | Balasingham Bahierathan, Christopher B. D'Aleo, Gregory M. Johnson, Muthukumaraamy Karthikeyan | 2017-02-07 |
| 8787074 | Static random access memory test structure | Oliver D. Patterson, Jin Z. Wallner, Thomas A. Wallner | 2014-07-22 |
| 8546155 | Via chains for defect localization | Christopher B. D'Aleo, Gregory M. Johnson, Muthukumarasamy Karthikeyan, Balasingham Bahierathan | 2013-10-01 |