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Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
WP

Weiwei Pan — 10 Patents

SESemitronix: 6 patents #1 of 17Top 6%
HCHefei Visionox Technology Co.: 2 patents #6 of 94Top 7%
HCHefei Boe Optoelectronics Technology Co.: 1 patents #418 of 784Top 55%
KCKunshan Go-Visionox Opto-Electronics Co.: 1 patents #185 of 390Top 50%
BOBOE: 1 patents #7,871 of 12,373Top 65%
Taiyuan, CN: #21 of 378 inventorsTop 6%
Overall (All Time): #481,000 of 4,157,543Top 15%
10 Patents All Time
Weiwei Pan has been granted 10 US patents while listed as an inventor at Semitronix. The first was granted in 2017 and the most recent in August 2025. Weiwei Pan ranks #481,000 of 4,157,543 US inventors in our database (top 11.6%). Patent records list Weiwei Pan in Taiyuan, CN.

Patents per Year

Patents granted per year, 2017 to 2025Bar chart with a peak of 2 patents in 2022.peak 22017: 1 patents20172018: 1 patents20182019: 1 patents20192020: 1 patents20202022: 2 patents20222023: 1 patents20232024: 1 patents20242025: 2 patents2025

Issued Patents All Time

Showing 1–10 of 10 patents

Patent #TitleCo-InventorsDate
12377160 Humanized anti-tissue factor antibody, antibody-drug conjugate prepared therefrom and use thereof Zhican Qu, Yi Zhao, Xin Yang, Quanai Zhang, Xinxin Liang +2 more 2025-08-05
12307982 Method and device for driving a display panel and display device Chuansheng Song, Wenxing LI, Yonggang Li, Mingwei GE, Xiujian ZHU 2025-05-20
12106718 Driving method and driving device for a display panel, and display device Wangwang He, Yonggang Li 2024-10-01
11668748 Addressable test chip Fan Lan, Shenzhi Yang, Yongjun Zheng 2023-06-06
11274971 Temperature sensor Zhong Tang, Zheng Shi, Zhenyan Huang 2022-03-15
11243251 Addressable test system with address register Fan Lan, Shenzhi Yang 2022-02-08
10804694 Over-temperature protection circuitry and driving method Ran Jiang, Hai Kang, Donghui Wang, Lei Hua, Zhen Tang +1 more 2020-10-13
10254339 Addressable test chip test system Fan Lan, Shenzhi Yang, Yongjun Zheng 2019-04-09
10156605 Addressable ring oscillator test chip Yongli Liu, Xu Ouyang, Yongjun Zheng, Zheng Shi, Lili Li 2018-12-18
9817058 Addressable test circuit and test method for key parameters of transistors Yongjun Zheng 2017-11-14