| 7219314 |
Application-specific methods for testing molectronic or nanoscale devices |
Steven M. Trimberger, Shekhar Bapat, Robert W. Wells, Andrew W. Lai |
2007-05-15 |
$4,958,000 |
| 7127697 |
Methods of utilizing programmable logic devices having localized defects in application-specific products |
Robert W. Wells, Andrew J. DeBaets |
2006-10-24 |
$12,015,000 |
| 7007250 |
Application-specific methods useful for testing look up tables in programmable logic devices |
Shekhar Bapat, Robert W. Wells, Andrew W. Lai |
2006-02-28 |
$9,649,000 |
| 6891395 |
Application-specific testing methods for programmable logic devices |
Robert W. Wells, Zhi-Min Ling, Vincent L. Tong, Jae-Weon Cho, Shahin Toutounchi |
2005-05-10 |
$16,848,000 |
| 6817006 |
Application-specific testing methods for programmable logic devices |
Robert W. Wells, Zhi-Min Ling, Vincent L. Tong, Jae-Weon Cho, Shahin Toutounchi |
2004-11-09 |
$16,507,000 |
| 6651238 |
Providing fault coverage of interconnect in an FPGA |
Robert W. Wells, Eric J. Thorne, Michael M. Matera |
2003-11-18 |
$28,405,000 |
| 6611477 |
Built-in self test using pulse generators |
Gil Speyer, David L. Ferguson, Daniel Chung, Robert W. Wells, Robert O. Conn |
2003-08-26 |
$61,911,000 |
| 6594610 |
Fault emulation testing of programmable logic devices |
Shahin Toutounchi, Anthony P. Calderone, Zhi-Min Ling, Eric J. Thorne, Robert W. Wells |
2003-07-15 |
$39,351,000 |
| 6594797 |
Methods and circuits for precise edge placement of test signals |
Rick W. Dudley, Jae-Weon Cho, Robert W. Wells |
2003-07-15 |
$39,351,000 |
| 6539508 |
Methods and circuits for testing programmable logic |
Robert W. Wells |
2003-03-25 |
$24,880,000 |
| 6466520 |
Built-in AC self test using pulse generators |
Gil Speyer, David L. Ferguson, Daniel Chung, Robert W. Wells, Robert O. Conn |
2002-10-15 |
$13,840,000 |
| 6356514 |
Built-in self test method for measuring clock to out delays |
Robert W. Wells, Robert O. Conn |
2002-03-12 |
$58,114,000 |
| 6233205 |
Built-in self test method for measuring clock to out delays |
Robert W. Wells, Robert O. Conn |
2001-05-15 |
$67,094,000 |
| 6232845 |
Circuit for measuring signal delays in synchronous memory elements |
Christopher H. Kingsley, Trevor J. Bauer, Robert W. Wells |
2001-05-15 |
$67,094,000 |
| 6219305 |
Method and system for measuring signal propagation delays using ring oscillators |
Robert W. Wells, Steven P. Young, Christopher H. Kingsley, Daniel Chung, Robert O. Conn |
2001-04-17 |
$57,440,000 |
| 6075418 |
System with downstream set or clear for measuring signal propagation delays on integrated circuits |
Christopher H. Kingsley, Robert W. Wells |
2000-06-13 |
$200,736,000 |
| 6069849 |
Method and system for measuring signal propagation delays using the duty cycle of a ring oscillator |
Christopher H. Kingsley, Robert W. Wells, Robert O. Conn |
2000-05-30 |
$73,070,000 |
