RP

Robert D. Patrie

AM AMD: 17 patents #646 of 9,279Top 7%
Overall (All Time): #279,313 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7219314 Application-specific methods for testing molectronic or nanoscale devices Steven M. Trimberger, Shekhar Bapat, Robert W. Wells, Andrew W. Lai 2007-05-15
7127697 Methods of utilizing programmable logic devices having localized defects in application-specific products Robert W. Wells, Andrew J. DeBaets 2006-10-24
7007250 Application-specific methods useful for testing look up tables in programmable logic devices Shekhar Bapat, Robert W. Wells, Andrew W. Lai 2006-02-28
6891395 Application-specific testing methods for programmable logic devices Robert W. Wells, Zhi-Min Ling, Vincent L. Tong, Jae-Weon Cho, Shahin Toutounchi 2005-05-10
6817006 Application-specific testing methods for programmable logic devices Robert W. Wells, Zhi-Min Ling, Vincent L. Tong, Jae-Weon Cho, Shahin Toutounchi 2004-11-09
6651238 Providing fault coverage of interconnect in an FPGA Robert W. Wells, Eric J. Thorne, Michael M. Matera 2003-11-18
6611477 Built-in self test using pulse generators Gil Speyer, David L. Ferguson, Daniel Chung, Robert W. Wells, Robert O. Conn 2003-08-26
6594797 Methods and circuits for precise edge placement of test signals Rick W. Dudley, Jae-Weon Cho, Robert W. Wells 2003-07-15
6594610 Fault emulation testing of programmable logic devices Shahin Toutounchi, Anthony P. Calderone, Zhi-Min Ling, Eric J. Thorne, Robert W. Wells 2003-07-15
6539508 Methods and circuits for testing programmable logic Robert W. Wells 2003-03-25
6466520 Built-in AC self test using pulse generators Gil Speyer, David L. Ferguson, Daniel Chung, Robert W. Wells, Robert O. Conn 2002-10-15
6356514 Built-in self test method for measuring clock to out delays Robert W. Wells, Robert O. Conn 2002-03-12
6232845 Circuit for measuring signal delays in synchronous memory elements Christopher H. Kingsley, Trevor J. Bauer, Robert W. Wells 2001-05-15
6233205 Built-in self test method for measuring clock to out delays Robert W. Wells, Robert O. Conn 2001-05-15
6219305 Method and system for measuring signal propagation delays using ring oscillators Robert W. Wells, Steven P. Young, Christopher H. Kingsley, Daniel Chung, Robert O. Conn 2001-04-17
6075418 System with downstream set or clear for measuring signal propagation delays on integrated circuits Christopher H. Kingsley, Robert W. Wells 2000-06-13
6069849 Method and system for measuring signal propagation delays using the duty cycle of a ring oscillator Christopher H. Kingsley, Robert W. Wells, Robert O. Conn 2000-05-30