| 8633722 |
Method and circuit for testing accuracy of delay circuitry |
— |
2014-01-21 |
| 8327201 |
Parallel testing of an integrated circuit that includes multiple dies |
— |
2012-12-04 |
| 7739564 |
Testing an integrated circuit using dedicated function pins |
Tuyet Ngoc Simmons |
2010-06-15 |
| 7728604 |
Testing differential signal standards using device under test's built in resistors |
Tuyet Ngoc Simmons, Brian M. Sadler, Michael Leonard Simmons |
2010-06-01 |
| 7724030 |
Method and apparatus for providing a feedback path for an output signal |
Steven E. McNeil |
2010-05-25 |
| 7685486 |
Testing of an embedded multiplexer having a plurality of inputs |
— |
2010-03-23 |
| 7620862 |
Method of and system for testing an integrated circuit |
— |
2009-11-17 |
| 7583102 |
Testing of input/output devices of an integrated circuit |
Tuyet Ngoc Simmons, Andy T. Nguyen, Randy J. Simmons, Shankar Lakkapragada |
2009-09-01 |
| 7219314 |
Application-specific methods for testing molectronic or nanoscale devices |
Steven M. Trimberger, Shekhar Bapat, Robert W. Wells, Robert D. Patrie |
2007-05-15 |
| 7187199 |
Structures and methods for testing programmable logic devices having mixed-fabric architectures |
— |
2007-03-06 |
| 7007250 |
Application-specific methods useful for testing look up tables in programmable logic devices |
Shekhar Bapat, Robert W. Wells, Robert D. Patrie |
2006-02-28 |
| 6944836 |
Structures and methods for testing programmable logic devices having mixed-fabric architectures |
— |
2005-09-13 |
| 6944809 |
Methods of resource optimization in programmable logic devices to reduce test time |
Randy J. Simmons, Teymour M. Mansour, Vincent L. Tong, Jeffrey V. Lindholm, Jay T. Young +2 more |
2005-09-13 |
| 6876218 |
Method for accurate output voltage testing |
Tuyet Ngoc Simmons |
2005-04-05 |
| 6732309 |
Method for testing faults in a programmable logic device |
Shahin Toutounchi |
2004-05-04 |