Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8065570 | Testing an integrated circuit having configurable input/output terminals | Madan M. Patra | 2011-11-22 |
| 7739564 | Testing an integrated circuit using dedicated function pins | Andrew W. Lai | 2010-06-15 |
| 7728604 | Testing differential signal standards using device under test's built in resistors | Brian M. Sadler, Michael Leonard Simmons, Andrew W. Lai | 2010-06-01 |
| 7653505 | Method and apparatus for testing a controlled impedance buffer | Madan M. Patra, Prasad Rau | 2010-01-26 |
| 7653504 | Method and apparatus for providing shorted pin information for integrated circuit testing | Michael Leonard Simmons | 2010-01-26 |
| 7583102 | Testing of input/output devices of an integrated circuit | Andy T. Nguyen, Andrew W. Lai, Randy J. Simmons, Shankar Lakkapragada | 2009-09-01 |
| 7392446 | Test channel usage reduction | Brian M. Sadler | 2008-06-24 |
| 6876218 | Method for accurate output voltage testing | Andrew W. Lai | 2005-04-05 |