| 6001663 |
Apparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the same |
Zhi-Min Ling, Yung-Tao Lin |
1999-12-14 |
| 5963780 |
Method for detecting defect sizes in polysilicon and source-drain semiconductor devices |
Zhi-Min Ling, Yung-Tao Lin |
1999-10-05 |
| 5930138 |
Arrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runs |
Yung-Tao Lin, Zhi-Min Ling, James M. Pak |
1999-07-27 |
| 5896294 |
Method and apparatus for inspecting manufactured products for defects in response to in-situ monitoring |
Wanyee A. Chow, Ming Chen, Yung-Tao Lin |
1999-04-20 |
| 5822717 |
Method and apparatus for automated wafer level testing and reliability data analysis |
Jerry Tsiang, Mikkel Lantz, Yeng-Kaung Peng |
1998-10-13 |
| 5821765 |
Apparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the same |
Zhi-Min Ling, Yung-Tao Lin |
1998-10-13 |
| 5787190 |
Method and apparatus for pattern recognition of wafer test bins |
Yeng-Kaung Peng, Siu May Ho |
1998-07-28 |
| 5761064 |
Defect management system for productivity and yield improvement |
Tho Le La |
1998-06-02 |
| 5761065 |
Arrangement and method for detecting sequential processing effects in manufacturing |
Richard Kittler, Zhi-Min Ling, James M. Pak, Yung-Tao Lin |
1998-06-02 |
| 5726920 |
Watchdog system having data differentiating means for use in monitoring of semiconductor wafer testing line |
Susan H. Chen, Chern-Jiann Lee |
1998-03-10 |
| 5716856 |
Arrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runs |
Yung-Tao Lin, Zhi-Min Ling, James M. Pak |
1998-02-10 |
| 5670891 |
Structures to extract defect size information of poly and source-drain semiconductor devices and method for making the same |
Zhi-Min Ling, Yung-Tao Lin |
1997-09-23 |
| 5598341 |
Real-time in-line defect disposition and yield forecasting system |
Zhi-Min Ling, Thao H. T. Vo, Siu May Ho, Yeng-Kaung Peng, Yung-Tao Lin |
1997-01-28 |