Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6001663 | Apparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the same | Zhi-Min Ling, Yung-Tao Lin | 1999-12-14 |
| 5963780 | Method for detecting defect sizes in polysilicon and source-drain semiconductor devices | Zhi-Min Ling, Yung-Tao Lin | 1999-10-05 |
| 5930138 | Arrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runs | Yung-Tao Lin, Zhi-Min Ling, James M. Pak | 1999-07-27 |
| 5896294 | Method and apparatus for inspecting manufactured products for defects in response to in-situ monitoring | Wanyee A. Chow, Ming Chen, Yung-Tao Lin | 1999-04-20 |
| 5822717 | Method and apparatus for automated wafer level testing and reliability data analysis | Jerry Tsiang, Mikkel Lantz, Yeng-Kaung Peng | 1998-10-13 |
| 5821765 | Apparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the same | Zhi-Min Ling, Yung-Tao Lin | 1998-10-13 |
| 5787190 | Method and apparatus for pattern recognition of wafer test bins | Yeng-Kaung Peng, Siu May Ho | 1998-07-28 |
| 5761064 | Defect management system for productivity and yield improvement | Tho Le La | 1998-06-02 |
| 5761065 | Arrangement and method for detecting sequential processing effects in manufacturing | Richard Kittler, Zhi-Min Ling, James M. Pak, Yung-Tao Lin | 1998-06-02 |
| 5726920 | Watchdog system having data differentiating means for use in monitoring of semiconductor wafer testing line | Susan H. Chen, Chern-Jiann Lee | 1998-03-10 |
| 5716856 | Arrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runs | Yung-Tao Lin, Zhi-Min Ling, James M. Pak | 1998-02-10 |
| 5670891 | Structures to extract defect size information of poly and source-drain semiconductor devices and method for making the same | Zhi-Min Ling, Yung-Tao Lin | 1997-09-23 |
| 5598341 | Real-time in-line defect disposition and yield forecasting system | Zhi-Min Ling, Thao H. T. Vo, Siu May Ho, Yeng-Kaung Peng, Yung-Tao Lin | 1997-01-28 |