Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11256020 | Light emitting structure | Chih-Yu Fan, Pu Fan | 2022-02-22 |
| 6830941 | Method and apparatus for identifying individual die during failure analysis | Boon Yong Ang, David Lin, Mehrdad Mahanpour | 2004-12-14 |
| 6516450 | Variable design rule tool | Wiley Eugene Hill, Kurt Taylor, Rithy Hang, Todd P. Lukanc | 2003-02-04 |
| 6028994 | Method for predicting performance of microelectronic device based on electrical parameter test data using computer model | Yeng-Kaung Peng, Siu May Ho | 2000-02-22 |
| 5726920 | Watchdog system having data differentiating means for use in monitoring of semiconductor wafer testing line | Susan H. Chen, Ying Shiau | 1998-03-10 |