Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8725748 | Method and system for storing and retrieving semiconductor tester information | Srikanth Sundararajan, Shivananda Shetty | 2014-05-13 |
| 7634127 | Efficient storage of fail data to aid in fault isolation | Srikanth Sundararajan, Shivananda Shetty | 2009-12-15 |
| 7137085 | Wafer level global bitmap characterization in integrated circuit technology development | John Jianshi Wang, Jeffrey P. Erhardt, Srikanth Sundararajan, David C. Newbury, Shivananda Shetty +2 more | 2006-11-14 |
| 6774395 | Apparatus and methods for characterizing floating body effects in SOI devices | Hung-Jen Lin, W Eugene Hill, Mario M. Pelella, Chern-Jann Lee, Srikanth Sundararajan | 2004-08-10 |
| 6028994 | Method for predicting performance of microelectronic device based on electrical parameter test data using computer model | Yeng-Kaung Peng, Chern-Jiann Lee | 2000-02-22 |
| 5787190 | Method and apparatus for pattern recognition of wafer test bins | Yeng-Kaung Peng, Ying Shiau | 1998-07-28 |
| 5598341 | Real-time in-line defect disposition and yield forecasting system | Zhi-Min Ling, Thao H. T. Vo, Ying Shiau, Yeng-Kaung Peng, Yung-Tao Lin | 1997-01-28 |