Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Wafer level global bitmap characterization in integrated circuit technology development

Wafer level global bitmap characterization in integrated circuit technology development

US Patent 7137085 · Granted Nov 14, 2006

Estimated economic value: $38,989,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Automated maternal and prenatal health diagnostics from ultrasound blind sweep v2025
Memory location mapping and unmapping2025
Methods of equalizing gate heights in embedded non-volatile memory on HKMG techn2025
Continuous monotonic counter for memory devices2024
Dynamic sensing levels for nonvolatile memory devices2024
Mesoporous nanocrystalline film architecture for capacitive storage devices2024
Erase power loss indicator (EPLI) implementation in flash memory device2024
Continuous monotonic counter for memory devices2023
Pickup article cognitive fitment2022
Suppression of program disturb with bit line and select gate voltage regulation2021
Leveraging shoppers for store pick up2021
Method of reducing charge loss in non-volatile memories2021