Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7137085 | Wafer level global bitmap characterization in integrated circuit technology development | John Jianshi Wang, Siu May Ho, Jeffrey P. Erhardt, Srikanth Sundararajan, David C. Newbury +2 more | 2006-11-14 |
| 7099789 | Characterizing distribution signatures in integrated circuit technology | Jeffrey P. Erhardt, Paul J. Steffan, Jerry Tsiang, Shivananda Shetty, John Jianshi Wang | 2006-08-29 |
| 6907379 | System and method for processing tester information and visualization for parameter with multiple distributions in integrated circuit technology development | Shivananda Shetty | 2005-06-14 |