Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 7099789 | Characterizing distribution signatures in integrated circuit technology | Franklyn Shihyu Wu, Jeffrey P. Erhardt, Paul J. Steffan, Shivananda Shetty, John Jianshi Wang | 2006-08-29 | $13,087,000 |
| 6461880 | Method for monitoring silicide failures | — | 2002-10-08 | $890,000 |
| 5822717 | Method and apparatus for automated wafer level testing and reliability data analysis | Mikkel Lantz, Yeng-Kaung Peng, Ying Shiau | 1998-10-13 | $2,622,000 |