Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7099789 | Characterizing distribution signatures in integrated circuit technology | Franklyn Shihyu Wu, Jeffrey P. Erhardt, Paul J. Steffan, Shivananda Shetty, John Jianshi Wang | 2006-08-29 |
| 6461880 | Method for monitoring silicide failures | — | 2002-10-08 |
| 5822717 | Method and apparatus for automated wafer level testing and reliability data analysis | Mikkel Lantz, Yeng-Kaung Peng, Ying Shiau | 1998-10-13 |