Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6028994 | Method for predicting performance of microelectronic device based on electrical parameter test data using computer model | Chern-Jiann Lee, Siu May Ho | 2000-02-22 |
| 5886909 | Defect diagnosis using simulation for IC yield improvement | Linda Milor, Khoi A. Phan, David A. Steele | 1999-03-23 |
| 5822717 | Method and apparatus for automated wafer level testing and reliability data analysis | Jerry Tsiang, Mikkel Lantz, Ying Shiau | 1998-10-13 |
| 5787190 | Method and apparatus for pattern recognition of wafer test bins | Siu May Ho, Ying Shiau | 1998-07-28 |
| 5598341 | Real-time in-line defect disposition and yield forecasting system | Zhi-Min Ling, Thao H. T. Vo, Siu May Ho, Ying Shiau, Yung-Tao Lin | 1997-01-28 |
| 5561293 | Method of failure analysis with CAD layout navigation and FIB/SEM inspection | Thao H. T. Vo, Paul Wong | 1996-10-01 |