Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for automated wafer level testing and reliability data analysis

Method and apparatus for automated wafer level testing and reliability data analysis

US Patent 5822717 · Granted Oct 13, 1998

Estimated economic value: $2,622,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Characterizing distribution signatures in integrated circuit technology2006
Method for monitoring silicide failures2002
Validating process data in manufacturing process management2000
Method for predicting performance of microelectronic device based on electrical 2000
Apparatus for detecting defect sizes in polysilicon and source-drain semiconduct1999
Method for detecting defect sizes in polysilicon and source-drain semiconductor 1999
Arrangement and method for detecting sequential processing effects in manufactur1999
Method and apparatus for inspecting manufactured products for defects in respons1999
Method and apparatus for integrated control of a sensor in a manufacturing proce1999
Defect diagnosis using simulation for IC yield improvement1999
Apparatus for detecting defect sizes in polysilicon and source-drain semiconduct1998
Method and apparatus for pattern recognition of wafer test bins1998