Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11385287 | Method for adaptively utilizing programmable logic devices | Andreas L. Astuti, Jian Shi | 2022-07-12 |
| 6507942 | Methods and circuits for testing a circuit fabrication process for device uniformity | Anthony P. Calderone, Feng Wang | 2003-01-14 |
| 6403385 | Method of inspecting a semiconductor wafer for defects | Subramanian Venkatkrishnan, Pei-Yuan Gao, Richard Lamm | 2002-06-11 |
| 6350627 | Interlevel dielectric thickness monitor for complex semiconductor chips | John Jianshi Wang, Hao Fang | 2002-02-26 |
| 6136510 | Doubled-sided wafer scrubbing for improved photolithography | Subramanian Venkatkrishnan, Mark T. Ramsbey, Jack F. Thomas, Kathleen R. Early | 2000-10-24 |
| 6072191 | Interlevel dielectric thickness monitor for complex semiconductor chips | John Jianshi Wang, Hao Fang | 2000-06-06 |
| 5780204 | Backside wafer polishing for improved photolithography | Subramanian Venkatkrishnan, Mark T. Ramsbey, Jack F. Thomas, Kathleen R. Early | 1998-07-14 |
| 5761064 | Defect management system for productivity and yield improvement | Ying Shiau | 1998-06-02 |