XW

Xin Wu

AM AMD: 14 patents #820 of 9,279Top 9%
YC Yangtze Memory Technologies Co.: 3 patents #227 of 626Top 40%
ED Empire Technology Development: 1 patents #283 of 547Top 55%
IN Intel: 1 patents #18,218 of 30,777Top 60%
Overall (All Time): #180,086 of 4,157,543Top 5%
23
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12136449 Capacitor structure and method of forming the same Liang Chen, Cheng Gan, Wei Liu 2024-11-05
11887646 Capacitor structure and method of forming the same Liang Chen, Cheng Gan, Wei Liu 2024-01-30
11743988 Power adjusting circuit, LED power supply and LED luminaire Zhong Chen 2023-08-29
11232825 Capacitor structure and method of forming the same Liang Chen, Cheng Gan, Wei Liu 2022-01-25
11043470 Inductor design in active 3D stacking technology Jing Jing, Shuxian Wu, Yohan Frans 2021-06-22
10871280 Connection terminal and illumination device Zhong Chen, Xinsheng Wang 2020-12-22
10742106 Alternating current power supply system and state monitoring circuit for the same, and power consumption equipment Zhong Chen 2020-08-11
9020618 Accelerometer based controller and/or controlled device Liang Gao, Kewan Chen 2015-04-28
8525428 Power supply apparatus and method for a backlight system Fan Chen, Chaoqun Sun, Qanqing Wu 2013-09-03
8266553 System and method for detecting mask data handling errors Bang-Thu Nguyen, Yan Wang, Hong-Tsz Pan 2012-09-11
7956385 Circuit for protecting a transistor during the manufacture of an integrated circuit device Yuhao Luo, Shuxian Wu, Jae-Gyung Ahn, Deepak Nayak, Daniel Gitlin 2011-06-07
7843184 Power supply with separate line regulation and load regulation Sen Dou 2010-11-30
7772093 Method of and circuit for protecting a transistor formed on a die Yuhao Luo, Shuxian Wu, Jae-Gyung Ahn, Deepak Nayak, Daniel Gitlin 2010-08-10
7765498 Methods of incorporating process-induced layout dimension changes into an integrated circuit simulation netlist Jonathan Ho, Yan Wang, Jane W. Sowards 2010-07-27
7737439 Semiconductor component having test pads and method and apparatus for testing same Mohsen H. Mardi, Jae-Weon Cho, Chih-Chung Wu, Shih-Liang Liang, Sanjiv Stokes +1 more 2010-06-15
7673270 Method and apparatus for compensating an integrated circuit layout for mechanical stress effects Yan Wang, Nui Chong, Hong-Tsz Pan, Bang-Thu Nguyen, Jonathan Ho +4 more 2010-03-02
7235412 Semiconductor component having test pads and method and apparatus for testing same Mohsen H. Mardi, Jae-Weon Cho, Chih-Chung Wu, Shih-Liang Liang, Sanjiv Stokes +1 more 2007-06-26
7064450 Semiconductor die with high density offset-inline bond arrangement Abu K. Eghan, Richard C. Li 2006-06-20
6868537 Method of generating an IC mask using a reduced database Jonathan Ho, Zicheng Gary Ling, Jan Lodewijk de Jong 2005-03-15
6645802 Method of forming a zener diode Sheau-Suey Li, Shahin Toutounchi, Michael J. Hart, Daniel Gitlin 2003-11-11
6569584 Methods and structures for protecting reticles from electrostatic damage Jonathan Ho 2003-05-27
6376131 Methods and structures for protecting reticles from ESD failure Jae-Weon Cho, Zhi-Min Ling 2002-04-23
6268639 Electrostatic-discharge protection circuit Sheau-Suey Li, Shahin Toutounchi, Michael J. Hart, Daniel Gitlin 2001-07-31