RC

Robert J. Chiu

AM AMD: 10 patents #1,209 of 9,279Top 15%
SL Spansion Llc.: 2 patents #309 of 769Top 45%
AD Adavanced Micro Devices: 1 patents #1 of 13Top 8%
Cypress Semiconductor: 1 patents #1,072 of 1,852Top 60%
Globalfoundries: 1 patents #2,221 of 4,424Top 55%
Overall (All Time): #382,563 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9299643 Ruthenium interconnect with high aspect ratio and method of fabrication thereof Zheng Wang, Connie P. Wang, Erik Wilson, Wen Yu 2016-03-29
7843015 Multi-silicide system in integrated circuit technology Paul R. Besser, Simon S. Chan, Jeffrey P. Patton, Austin Frenkel, Thorsten Kammler +1 more 2010-11-30
7670915 Contact liner in integrated circuit technology Errol Todd Ryan, Paul R. Besser, Simon S. Chan, Mehrdad Mahanpour, Minh Van Ngo 2010-03-02
7468296 Thin film germanium diode with low reverse breakdown Ercan Adem, Matthew S. Buynoski, Bryan K. Choo, Calvin T. Gabriel, Joong S. Jeon +5 more 2008-12-23
7378310 Method for manufacturing a memory device having a nanocrystal charge storage region Connie P. Wang, Zoran Krivokapic, Suzette K. Pangrle, Lu You 2008-05-27
7307322 Ultra-uniform silicide system in integrated circuit technology Jeffrey P. Patton, Paul R. Besser, Minh Van Ngo 2007-12-11
7151020 Conversion of transition metal to silicide through back end processing in integrated circuit technology Jeffrey P. Patton, Austin Frenkel, Thorsten Kammler, Errol Todd Ryan, Darin A. Chan +3 more 2006-12-19
7049666 Low power pre-silicide process in integrated circuit technology Jeffrey P. Patton, Paul R. Besser, Minh Van Ngo 2006-05-23
7005357 Low stress sidewall spacer in integrated circuit technology Minh Van Ngo, Simon S. Chan, Paul R. Besser, Paul L. King, Errol Todd Ryan 2006-02-28
7005376 Ultra-uniform silicides in integrated circuit technology Jeffrey P. Patton, Paul R. Besser, Minh Van Ngo 2006-02-28
6969678 Multi-silicide in integrated circuit technology Paul R. Besser, Simon S. Chan, Jeffrey P. Patton, Austin Frenkel, Thorsten Kammler +1 more 2005-11-29
6576548 Method of manufacturing a semiconductor device with reliable contacts/vias Amy C. Tu, Minh Van Ngo, Austin Frenkel, Jeff P. Erhardt 2003-06-10
6171737 Low cost application of oxide test wafer for defect monitor in photolithography process Khoi A. Phan, Shobhana Punjabi, Bhanwar Singh 2001-01-09