Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Bryan K. Choo — 35 Patents

AMD: 31 patents #314 of 9,280Top 4%
SLSpansion Llc.: 3 patents #241 of 769Top 35%
Cypress Semiconductor: 1 patents #1,072 of 1,852Top 60%
Mountain View, CA: #482 of 11,022 inventorsTop 5%
California: #14,008 of 386,348 inventorsTop 4%
Overall (All Time): #96,288 of 4,157,543Top 3%
35 Patents All Time
Bryan K. Choo has been granted 35 US patents while listed as an inventor at AMD. The first was granted in 1999 and the most recent in May 2016. Bryan K. Choo ranks #96,288 of 4,157,543 US inventors in our database (top 2.3%). Patent records list Bryan K. Choo in Mountain View, CA, US.

Issued Patents All Time

Showing 1–25 of 35 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
9343666 Damascene metal-insulator-metal (MIM) device with improved scaleability Suzette K. Pangrle, Steven C. Avanzino, Sameer Haddad, Michael VanBuskirk, Manuj Rathor +5 more 2016-05-17 $12,063,000
8232175 Damascene metal-insulator-metal (MIM) device with improved scaleability Suzette K. Pangrle, Steven C. Avanzino, Sameer Haddad, Michael VanBuskirk, Manuj Rathor +5 more 2012-07-31 $2,423,000
8089113 Damascene metal-insulator-metal (MIM) device Suzette K. Pangrle, Steven C. Avanzino, Sameer Haddad, Michael VanBuskirk, Manuj Rathor +5 more 2012-01-03 $2,103,000
7468296 Thin film germanium diode with low reverse breakdown Ercan Adem, Matthew S. Buynoski, Robert J. Chiu, Calvin T. Gabriel, Joong S. Jeon +5 more 2008-12-23
7173648 System and method for visually monitoring a semiconductor processing system Khoi A. Phan, Bharath Rangarajan, Bhanwar Singh 2007-02-06 $46,392,000
7080330 Concurrent measurement of critical dimension and overlay in semiconductor manufacturing Bharath Rangarajan, Bhanwar Singh, Carmen Morales 2006-07-18 $7,111,000
6912438 Using scatterometry to obtain measurements of in circuit structures Bhanwar Singh, Ramkumar Subramanian, Bharath Rangarajan 2005-06-28 $6,294,000
6884999 Use of scanning probe microscope for defect detection and repair Sanjay K. Yedur, Bhanwar Singh 2005-04-26 $7,241,000
6829380 Optimization of OPC design factors utilizing an advanced algorithm on a low voltage CD-SEM system Bhanwar Singh, Sanjay K. Yedur 2004-12-07 $8,137,000
6635874 Self-cleaning technique for contamination on calibration sample in SEM Bhanwar Singh, Michael K. Templeton, Sanjay K. Yedur 2003-10-21 $8,084,000
6634805 Parallel plate development Michael K. Templeton, Khoi A. Phan, Bharath Rangarajan, Ramkumar Subramanian 2003-10-21 $8,084,000
6632283 System and method for illuminating a semiconductor processing system Bhanwar Singh, Bharath Rangarajan, Khoi A. Phan, Ramkumar Subramanian 2003-10-14 $7,133,000
6591658 Carbon nanotubes as linewidth standards for SEM & AFM Sanjay K. Yedur, Bhanwar Singh, Michael K. Templeton, Ramkumar Subramanian 2003-07-15 $1,952,000
6572252 System and method for illuminating a semiconductor processing system Bharath Rangarajan, Bhanwar Singh, Khoi A. Phan, Ramkumar Subramanian 2003-06-03 $3,251,000
6566655 Multi-beam SEM for sidewall imaging Bhanwar Singh, Sanjay K. Yedur 2003-05-20 $2,116,000
6559446 System and method for measuring dimensions of a feature having a re-entrant profile Bhanwar Singh 2003-05-06 $2,132,000
6516528 System and method to determine line edge roughness and/or linewidth Bhanwar Singh 2003-02-11 $2,033,000
6507474 Using localized ionizer to reduce electrostatic charge from wafer and mask Bhanwar Singh, Ramkumar Subramanian, Khoi A. Phan, Bharath Rangarajan 2003-01-14 $2,234,000
6479820 Electrostatic charge reduction of photoresist pattern on development track Bhanwar Singh, Ramkumar Subramanian, Bharath Rangarajan, Khoi A. Phan 2002-11-12 $1,765,000
6479817 Cantilever assembly and scanning tip therefor with associated optical sensor Sanjay K. Yedur, Bhanwar Singh, Carmen Morales 2002-11-12 $1,765,000
6462343 System and method of providing improved CD-SEM pattern recognition of structures with variable contrast 2002-10-08 $890,000
6459482 Grainless material for calibration sample Bhanwar Singh, Ramkumar Subramanian, Khoi A. Phan, Bharath Rangarajan, Michael K. Templeton +1 more 2002-10-01 $734,000
6455847 Carbon nanotube probes in atomic force microscope to detect partially open/closed contacts Sanjay K. Yedur, Bhanwar Singh 2002-09-24 $1,057,000
6452161 Scanning probe microscope having optical fiber spaced from point of hp Sanjay K. Yedur, Bhanwar Singh, Carmen Morales 2002-09-17 $1,456,000
6451512 UV-enhanced silylation process to increase etch resistance of ultra thin resists Bharath Rangarajan, Ramkumar Subramanian, Khoi A. Phan, Bhanwar Singh, Michael K. Templeton +1 more 2002-09-17 $1,456,000