| 11075339 |
Correlated electron material (CEM) devices with contact region sidewall insulation |
Ming He, Paul R. Besser, Jingyan Zhang |
2021-07-27 |
|
| 10707415 |
Methods and processes for forming devices from correlated electron material (CEM) |
Lucian Shifren, Kimberly Gay Reid, Gregory Munson Yeric, Glen Arnold Rosendale |
2020-07-07 |
|
| 10672982 |
Fabrication of correlated electron material (CEM) devices |
Ming He, Paul R. Besser, Jingyan Zhang |
2020-06-02 |
|
| 10141504 |
Methods and processes for forming devices from correlated electron material (CEM) |
Lucian Shifren, Kimberly Gay Reid, Greg Yeric, Glen Arnold Rosendale |
2018-11-27 |
|
| 9343666 |
Damascene metal-insulator-metal (MIM) device with improved scaleability |
Suzette K. Pangrle, Steven C. Avanzino, Sameer Haddad, Michael VanBuskirk, James J. Xie +5 more |
2016-05-17 |
$12,063,000 |
| 8803120 |
Diode and resistive memory device structures |
An-Chung Chen, Steven C. Avanzino, Suzette K. Pangrle |
2014-08-12 |
$1,424,000 |
| 8717803 |
Metal-insulator-metal-insulator-metal (MIMIM) memory device |
Suzette K. Pangrle, Steven C. Avanzino, Zhida Lan |
2014-05-06 |
$1,144,000 |
| 8373148 |
Memory device with improved performance |
Zhida Lan, Joffre F. Bernard |
2013-02-12 |
$2,724,000 |
| 8232175 |
Damascene metal-insulator-metal (MIM) device with improved scaleability |
Suzette K. Pangrle, Steven C. Avanzino, Sameer Haddad, Michael VanBuskirk, James J. Xie +5 more |
2012-07-31 |
$2,423,000 |
| 8093698 |
Gettering/stop layer for prevention of reduction of insulating oxide in metal-insulator-metal device |
Matthew S. Buynoski, Joffre F. Bernard, Steven C. Avanzino, Suzette K. Pangrle |
2012-01-10 |
$945,000 |
| 8093680 |
Metal-insulator-metal-insulator-metal (MIMIM) memory device |
Suzette K. Pangrle, Steven C. Avanzino, Zhida Lan |
2012-01-10 |
$945,000 |
| 8089113 |
Damascene metal-insulator-metal (MIM) device |
Suzette K. Pangrle, Steven C. Avanzino, Sameer Haddad, Michael VanBuskirk, James J. Xie +5 more |
2012-01-03 |
$2,103,000 |
| 8084770 |
Test structures for development of metal-insulator-metal (MIM) devices |
Steven C. Avanzino, Suzette K. Pangrle, An-Chung Chen, Sameer Haddad, Nicholas H. Tripsas +1 more |
2011-12-27 |
$1,482,000 |
| 8035099 |
Diode and resistive memory device structures |
An-Chung Chen, Steven C. Avanzino, Suzette K. Pangrle |
2011-10-11 |
$2,963,000 |
| 7772077 |
Method of forming a semiconductor structure comprising a field effect transistor having a stressed channel region |
Andreas Gehring, Andy Wei, Anthony Mowry |
2010-08-10 |
$9,033,000 |
| 7468525 |
Test structures for development of metal-insulator-metal (MIM) devices |
Steven C. Avanzino, Suzette K. Pangrle, An-Chung Chen, Sameer Haddad, Nicholas H. Tripsas +1 more |
2008-12-23 |
$556,000 |
| 7323377 |
Increasing self-aligned contact areas in integrated circuits using a disposable spacer |
Mehran Sedigh, Alain Blosse, Dutta Saurabh Chowdhury |
2008-01-29 |
$10,234,000 |
| 6969689 |
Method of manufacturing an oxide-nitride-oxide (ONO) dielectric for SONOS-type devices |
Krishnaswamy Ramkumar, Biju Parameshwaran, Loren T. Lancaster |
2005-11-29 |
|
| 6818558 |
Method of manufacturing a dielectric layer for a silicon-oxide-nitride-oxide-silicon (SONOS) type devices |
Krishnaswamy Ramkumar, Fred Jenne, Loren T. Lancaster |
2004-11-16 |
$2,800,000 |
| 6624052 |
Process for annealing semiconductors and/or integrated circuits |
Krishnaswamy Ramkumar |
2003-09-23 |
$6,596,000 |
| 6436799 |
Process for annealing semiconductors and/or integrated circuits |
Krishnaswamy Ramkumar |
2002-08-20 |
$9,619,000 |
| 6372634 |
Plasma etch chemistry and method of improving etch control |
Jianmin Qiao, Sanjay Thekdi, James E. Nulty |
2002-04-16 |
$5,901,000 |
