Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7804317 | Test device for determining charge damage to a transistor | Sriram Madhavan, Andrew Carlson | 2010-09-28 |
| 7205164 | Methods for fabricating magnetic cell junctions and a structure resulting and/or used for such methods | Sam Geha, Benjamin Schwarz, Chang Ju Choi, Eugene Chen, Helen L. Chung +2 more | 2007-04-17 |
| 6969689 | Method of manufacturing an oxide-nitride-oxide (ONO) dielectric for SONOS-type devices | Krishnaswamy Ramkumar, Manuj Rathor, Loren T. Lancaster | 2005-11-29 |
| 6794269 | Method for and structure formed from fabricating a relatively deep isolation structure | Prabhuram Gopalan, Krishnaswamy Ramkumar, Hanna Bamnolker, Sundar Narayanan | 2004-09-21 |