Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10968803 | Systems and methods for idle fuel economy mode | Minming Zhao, Josh Si Shao, Matthew John Zanker | 2021-04-06 |
| 10392990 | Systems and methods for idle fuel economy mode | Minming Zhao, Josh Si Shao, Matthew John Zanker | 2019-08-27 |
| 10372871 | IC layout post-decomposition mask allocation optimization | Lynn Wang | 2019-08-06 |
| 10095826 | Feed-forward for silicon inspections (DFM2CFM : design to silicon) and feed-back for weakpoint predictor decks (CFM2DFM : silicon to design) guided by marker classification, sampling, and higher dimensional analysis | Shikha Somani, Thomas Herrmann, Stefan Schuler, Uwe Schroeder, Shobhit Malik +1 more | 2018-10-09 |
| 10055535 | Method, system and program product for identifying anomalies in integrated circuit design layouts | Piyush Pathak, Robert C. Pack, Wei-Long Wang, Karthik Krishnamoorthy, Fadi Batarseh +1 more | 2018-08-21 |
| 8918745 | Stitch insertion for reducing color density differences in double patterning technology (DPT) | Lynn Wang, Luigi Capodieci | 2014-12-23 |
| 8745553 | Method and apparatus for applying post graphic data system stream enhancements | Swamy Muddu, Shobhit Malik | 2014-06-03 |
| 8656336 | Pattern based method for identifying design for manufacturing improvement in a semiconductor device | Piyush Pathak, Shobhit Malik | 2014-02-18 |
| 8516407 | Methods for quantitatively evaluating the quality of double patterning technology-compliant layouts | Lynn Wang, Luigi Capodieci | 2013-08-20 |
| 8293606 | Body tie test structure for accurate body effect measurement | Qiang Chen, Darin A. Chan, Jung-Suk Goo | 2012-10-23 |
| 7880229 | Body tie test structure for accurate body effect measurement | Qiang Chen, Darin A. Chan, Jung-Suk Goo | 2011-02-01 |
| 7804317 | Test device for determining charge damage to a transistor | Biju Parameshwaran, Andrew Carlson | 2010-09-28 |
| 6534378 | Method for forming an integrated circuit device | Krishnaswamy Ramkumar, Chidambaram G. Kallingal | 2003-03-18 |