Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10311186 | Three-dimensional pattern risk scoring | Jaime Bravo, Vikrant Chauhan, Piyush Pathak, Uwe Schroeder | 2019-06-04 |
| 10095826 | Feed-forward for silicon inspections (DFM2CFM : design to silicon) and feed-back for weakpoint predictor decks (CFM2DFM : silicon to design) guided by marker classification, sampling, and higher dimensional analysis | Shikha Somani, Sriram Madhavan, Thomas Herrmann, Stefan Schuler, Uwe Schroeder +1 more | 2018-10-09 |
| 8745553 | Method and apparatus for applying post graphic data system stream enhancements | Swamy Muddu, Sriram Madhavan | 2014-06-03 |
| 8656336 | Pattern based method for identifying design for manufacturing improvement in a semiconductor device | Piyush Pathak, Sriram Madhavan | 2014-02-18 |
| 7487479 | Systematic approach for applying recommended rules on a circuit layout | Hsiu-Nien Chen, Bob Yu, Wai Kit Leong | 2009-02-03 |
| 7191425 | Method and apparatus for inserting extra tracks during library architecture migration | — | 2007-03-13 |