Issued Patents 2020
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10879068 | Extreme ultraviolet lithography for high volume manufacture of a semiconductor device | Yongan Xu, Yann Mignot, Oleg Gluschenkov | 2020-12-29 |
| 10833258 | MRAM device formation with in-situ encapsulation | Ashim Dutta, Chih-Chao Yang, Daniel C. Edelstein, Karthik Yogendra | 2020-11-10 |
| 10833257 | Formation of embedded magnetic random-access memory devices with multi-level bottom electrode via contacts | Ashim Dutta, Chih-Chao Yang, Theodorus E. Standaert | 2020-11-10 |
| 10748823 | Embedded etch rate reference layer for enhanced etch time precision | Yann Mignot, Alan C. Thomas, Daniel P. Sanders, Dario L. Goldfarb, Nelson Felix +1 more | 2020-08-18 |
| 10714683 | Multilayer hardmask for high performance MRAM devices | Michael Rizzolo, Daniel C. Edelstein, Theodorus E. Standaert, Kisup Chung, Isabel Cristina Chu | 2020-07-14 |
| 10707413 | Formation of embedded magnetic random-access memory devices | Ashim Dutta, Chih-Chao Yang, Michael Rizzolo, Jon Slaughter | 2020-07-07 |
| 10685879 | Lithographic alignment of a conductive line to a via | Ashim Dutta, Dominik Metzler, Takeshi Nogami | 2020-06-16 |
| 10680169 | Multilayer hardmask for high performance MRAM devices | Michael Rizzolo, Daniel C. Edelstein, Theodorus E. Standaert, Kisup Chung, Isabel Cristina Chu | 2020-06-09 |
| 10580652 | Alternating hardmasks for tight-pitch line formation | Anuja E. DeSilva, Nelson Felix, Chi-Chun Liu, Yann Mignot, Stuart A. Sieg | 2020-03-03 |
| 10559467 | Selective gas etching for self-aligned pattern transfer | Sean D. Burns, Yann Mignot, Yongan Xu | 2020-02-11 |