KW

Kenji Watanabe

HI Hitachi: 7 patents #37 of 3,771Top 1%
Canon: 2 patents #525 of 2,442Top 25%
HC Hitachi Engineering Co.: 1 patents #3 of 53Top 6%
HC Hitachi Tokyo Electronics Co.: 1 patents #1 of 17Top 6%
KC King Jim Co.: 1 patents #5 of 21Top 25%
SE Seiko Epson: 1 patents #357 of 889Top 45%
Sumitomo Electric Industries: 1 patents #1,470 of 4,178Top 40%
Fujitsu Limited: 1 patents #1,098 of 3,370Top 35%
SO Sony: 1 patents #794 of 2,482Top 35%
HC Hitachi Car Engineering Co.: 1 patents #39 of 145Top 30%
Overall (2004): #747 of 270,089Top 1%
13
Patents 2004

Issued Patents 2004

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
6834174 Image forming apparatus and rotary body detection device Chikara Imaizumi, Seiji Obata, Takayuki Miyamoto 2004-12-21
6832066 Image forming apparatus driving conveying medium or intermediate transferring medium and control method therefor Shigeru Kameyama 2004-12-14
6820864 Fuel vaporization promoting apparatus and fuel carburetion accelerator Kiyoshi Amou, Yuzo Kadomukai, Hiroaki Saeki, Takanobu Ichihara, Masami Nagano 2004-11-23
6797975 Method and its apparatus for inspecting particles or defects of a semiconductor device Hidetoshi Nishiyama, Minori Noguchi, Yoshimasa Ooshima, Akira Hamamatsu, Tetsuya Watanabe +1 more 2004-09-28
6788433 Character information processor Tomoyuki Ichikawa, Kenichi Tanabe, Shinichi Tsukagoshi, Masahiko Nunokawa 2004-09-07
6777677 Method of inspecting pattern and inspecting instrument Mari Nozoe, Hidetoshi Nishiyama, Shigeaki Hijikata, Koji Abe 2004-08-17
6757621 Process management system Fumio Mizuno, Seiji Isogai, Yasuhiro Yoshitake, Terushige Asakawa, Yuichi Ohyama +12 more 2004-06-29
6755371 Film winding method, film winding apparatus, and film manufacturing apparatus Akio Hiroi, Fujio Kuwabara 2004-06-29
6756589 Method for observing specimen and device therefor Kenji Obara, Yuji Takagi, Atsushi Shimoda, Ryou Nakagaki, Seiji Isogai +3 more 2004-06-29
6720541 High frequency heating apparatus with temperature detection means Kazuo Fujishita, Tomotaka Nobue, Takesi Takizaki, Isao Mizuta, Akemi Fukumoto 2004-04-13
6709166 Connector assembly with multi-part housing Akihiro Miyachi, Masashi Seto, Kazuhiro Shimada, Hideo Tamura 2004-03-23
6703850 Method of inspecting circuit pattern and inspecting instrument Mari Nozoe, Hiroyuki Shinada, Keiichi Saiki, Aritoshi Sugimoto, Hiroshi Morioka +2 more 2004-03-09
6690469 Method and apparatus for observing and inspecting defects Yukihiro Shibata, Shunji Maeda, Kazuo Yamaguchi, Minoru Yoshida, Atsushi Yoshida +1 more 2004-02-10