Issued Patents 2004
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6819416 | Defect inspection method and apparatus therefor | Shunji Maeda, Atsushi Yoshida, Minoru Yoshida, Sachio Uto, Hiroaki Shishido +1 more | 2004-11-16 |
| 6762831 | Method and apparatus for inspecting defects | Shunji Maeda | 2004-07-13 |
| 6690469 | Method and apparatus for observing and inspecting defects | Shunji Maeda, Kazuo Yamaguchi, Minoru Yoshida, Atsushi Yoshida, Kenji Oka +1 more | 2004-02-10 |
| 6674890 | Defect inspection method and apparatus therefor | Shunji Maeda, Kenji Oka, Hiroshi Makihira, Yasuhiko Nakayama, Minoru Yoshida +1 more | 2004-01-06 |