Issued Patents 2004
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6834132 | Fiber-wired sheet and method for manufacturing the same | Katsuaki Kondo, Kazuo Imamura, Shogo Ikunishi | 2004-12-21 |
| 6831737 | Apparatus and method for inspecting pattern | Sachio Uto, Toshihiko Nakata, Shunzi Maeda, Atsushi Shimoda | 2004-12-14 |
| 6819416 | Defect inspection method and apparatus therefor | Shunji Maeda, Atsushi Yoshida, Yukihiro Shibata, Sachio Uto, Hiroaki Shishido +1 more | 2004-11-16 |
| 6805147 | Automatic water supply system | Takaharu Yoshioka | 2004-10-19 |
| 6800859 | Method and equipment for detecting pattern defect | Hiroaki Shishido, Yasuhiro Yoshitake, Toshihiko Nakata, Shunji Maeda, Sachio Uto | 2004-10-05 |
| 6798961 | Optical fiber and optical fiber wiring board using the optical fiber | Katsuaki Kondo | 2004-09-28 |
| 6785486 | Image forming apparatus | Takao Izumi | 2004-08-31 |
| 6775702 | Computer system including a device with a plurality of identifiers | Takashi Oeda, Kiyoshi Honda, Naoto Matsunami | 2004-08-10 |
| 6765201 | Ultraviolet laser-generating device and defect inspection apparatus and method therefor | Sachio Uto, Toshihiko Nakata, Shunji Maeda | 2004-07-20 |
| 6748500 | Storage device and method for data sharing | Motohiro Kanda, Akira Yamamoto, Toshio Nakano | 2004-06-08 |
| 6721047 | Method and apparatus for inspecting defects of a specimen | Atsushi Shimoda, Sachio Uto, Shunji Maeda, Toshihiko Nakata | 2004-04-13 |
| 6706213 | Phosphor, radiation detector containing the same, and X-ray CT apparatus | Hiromichi Yamada, Tsuneyuki Kanai, Takaaki Kobiki, Ichiro Miura, Makoto Sato | 2004-03-16 |
| 6696784 | Light emitting diode module | Haruo Matsumoto | 2004-02-24 |
| 6697560 | Structure for holding optical fiber | Katsuaki Kondo, Kazuo Imamura | 2004-02-24 |
| 6690469 | Method and apparatus for observing and inspecting defects | Yukihiro Shibata, Shunji Maeda, Kazuo Yamaguchi, Atsushi Yoshida, Kenji Oka +1 more | 2004-02-10 |
| 6674890 | Defect inspection method and apparatus therefor | Shunji Maeda, Kenji Oka, Hiroshi Makihira, Yasuhiko Nakayama, Yukihiro Shibata +1 more | 2004-01-06 |