Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6674890 | Defect inspection method and apparatus therefor | Shunji Maeda, Kenji Oka, Yasuhiko Nakayama, Minoru Yoshida, Yukihiro Shibata +1 more | 2004-01-06 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6674890 | Defect inspection method and apparatus therefor | Shunji Maeda, Kenji Oka, Yasuhiko Nakayama, Minoru Yoshida, Yukihiro Shibata +1 more | 2004-01-06 |