Issued Patents 2004
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6792366 | Method and apparatus for inspecting defects in a semiconductor wafer | Naoki Hosoya, Yuuji Takagi, Hisae Shibuya | 2004-09-14 |
| 6792367 | Method and apparatus for inspecting defects in a semiconductor wafer | Naoki Hosoya, Yuuji Takagi, Hisae Shibuya | 2004-09-14 |
| 6756589 | Method for observing specimen and device therefor | Yuji Takagi, Atsushi Shimoda, Ryou Nakagaki, Seiji Isogai, Yasuhiko Ozawa +3 more | 2004-06-29 |
| 6741941 | Method and apparatus for analyzing defect information | Yuji Takagi, Hisae Shibuya | 2004-05-25 |