Issued Patents 2004
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6828554 | Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same | Takashi Hiroi, Maki Tanaka, Masahiro Watanabe, Asahiro Kuni, Yukio Matsuyama +3 more | 2004-12-07 |
| RE38611 | Method for substituting defective recording of discoid recording medium and discoid recording medium recording and reproducing device | Takahiro Nagai, Yoshihisa Fukushima, Shunji Ohara, Isao Satoh | 2004-10-05 |
| 6797526 | Method for manufacturing semiconductor devices and method and its apparatus for processing detected defect data | Maki Tanaka, Shunji Maeda, Minori Noguchi, Takafumi Okabe, Chie Shishido | 2004-09-28 |
| 6756589 | Method for observing specimen and device therefor | Kenji Obara, Atsushi Shimoda, Ryou Nakagaki, Seiji Isogai, Yasuhiko Ozawa +3 more | 2004-06-29 |
| 6741941 | Method and apparatus for analyzing defect information | Kenji Obara, Hisae Shibuya | 2004-05-25 |
| 6728195 | Multi-layered optical disk with shifted track and layer identification and method of detecting a track | Isao Satoh, Yoshihisa Fukushima, Yasushi Azumatani, Hiroshi Hamasaka | 2004-04-27 |
| 6717142 | Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same | Takashi Hiroi, Maki Tanaka, Masahiro Watanabe, Asahiro Kuni, Yukio Matsuyama +3 more | 2004-04-06 |
| 6678227 | Simultaneous recording and reproduction apparatus and simultaneous multi-channel reproduction apparatus | Satoshi Kondo, Hideki Fukuda, Yoshinari Takemura, Masaaki Kondo, Keiichi Kawashima | 2004-01-13 |