Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6792359 | Method for inspecting defect and system therefor | Takanori Ninomiya, Shigeru Matsui, Toshiei Kurosaki | 2004-09-14 |
| 6756589 | Method for observing specimen and device therefor | Kenji Obara, Yuji Takagi, Atsushi Shimoda, Ryou Nakagaki, Yasuhiko Ozawa +3 more | 2004-06-29 |
| 6757621 | Process management system | Fumio Mizuno, Kenji Watanabe, Yasuhiro Yoshitake, Terushige Asakawa, Yuichi Ohyama +12 more | 2004-06-29 |