Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6765204 | Microstructured pattern inspection method | Fumihiro Sasajima, Osamu Komuro | 2004-07-20 |
| 6757621 | Process management system | Seiji Isogai, Kenji Watanabe, Yasuhiro Yoshitake, Terushige Asakawa, Yuichi Ohyama +12 more | 2004-06-29 |