Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6792359 | Method for inspecting defect and system therefor | Takanori Ninomiya, Seiji Isogai, Shigeru Matsui | 2004-09-14 |
| 6765205 | Electron microscope including apparatus for X-ray analysis and method of analyzing specimens using same | Isao Ochiai, Toshiro Kubo, Naomasa Suzuki | 2004-07-20 |