Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6765205 | Electron microscope including apparatus for X-ray analysis and method of analyzing specimens using same | Isao Ochiai, Toshiei Kurosaki, Toshiro Kubo | 2004-07-20 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6765205 | Electron microscope including apparatus for X-ray analysis and method of analyzing specimens using same | Isao Ochiai, Toshiei Kurosaki, Toshiro Kubo | 2004-07-20 |