MW

Masahiro Watanabe

HI Hitachi: 7 patents #37 of 3,771Top 1%
MA Makita: 1 patents #3 of 27Top 15%
TK Tanaka Kikinzoku Kogyo K.K.: 1 patents #6 of 12Top 50%
UN Unknown: 1 patents #216 of 2,810Top 8%
PA Panasonic: 1 patents #56 of 362Top 20%
OC Oki Electric Industry Co.: 1 patents #84 of 313Top 30%
📍 Windsor, CO: #1 of 29 inventorsTop 4%
🗺 Colorado: #7 of 2,989 inventorsTop 1%
Overall (2004): #896 of 270,089Top 1%
12
Patents 2004

Issued Patents 2004

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
6828554 Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same Takashi Hiroi, Maki Tanaka, Asahiro Kuni, Yukio Matsuyama, Yuji Takagi +3 more 2004-12-07
6825480 Charged particle beam apparatus and automatic astigmatism adjustment method Hiroyuki Shinada, Atsuko Takafuji, Masami Iizuka, Yasuhiro Gunji, Kouichi Hayakawa +1 more 2004-11-30
6793483 Combustion burner 2004-09-21
6788919 Cellular phone 2004-09-07
6768226 Electric circuit shielding Kazuo Kato 2004-07-27
6768315 Voltage measuring apparatus for sheathed power cable Kazuo Kato, Masayuki Tani, Ikurou Masuda 2004-07-27
6766172 Road vehicle communication method using light and radio Kiyohito Tokuda, Kinya Asano, Masayuki Fujise, Fumihide Kojima, Ryobun Tachita 2004-07-20
6753518 Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus Takashi Hiroi, Maki Tanaka, Hiroyuki Shinada, Yasutsugu Usami 2004-06-22
6744057 Convergent charged particle beam apparatus and inspection method using same Maki Tanaka, Takashi Hiroi, Hiroyuki Shinada, Taku Ninomiya 2004-06-01
6726890 Catalyst for oxidizing reformed gas 2004-04-27
6717142 Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same Takashi Hiroi, Maki Tanaka, Asahiro Kuni, Yukio Matsuyama, Yuji Takagi +3 more 2004-04-06
6687567 Power tools 2004-02-03