Issued Patents 2004
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6828554 | Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same | Takashi Hiroi, Maki Tanaka, Masahiro Watanabe, Asahiro Kuni, Yukio Matsuyama +3 more | 2004-12-07 |
| 6780660 | System for testing electronic devices | Yuichi Hamamura, Takaaki Kumazawa, Hisao Asakura, Kazuyuki Tsunokuni | 2004-08-24 |
| 6770496 | Method of testing electronic devices | Yuichi Hamamura, Takaaki Kumazawa, Hisao Asakura, Kazuyuki Tsunokuni | 2004-08-03 |
| 6771077 | Method of testing electronic devices indicating short-circuit | Yuichi Hamamura, Takaaki Kumazawa, Hisao Asakura, Kazuyuki Tsunokuni | 2004-08-03 |
| 6760472 | Identification method for an article using crystal defects | Kazuo Takeda, Takanori Ninomiya | 2004-07-06 |
| 6734687 | Apparatus for detecting defect in device and method of detecting defect | Tohru Ishitani, Hidemi Koike, Isamu Sekihara, Kaoru Umemura, Satoshi Tomimatsu +1 more | 2004-05-11 |
| 6717142 | Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same | Takashi Hiroi, Maki Tanaka, Masahiro Watanabe, Asahiro Kuni, Yukio Matsuyama +3 more | 2004-04-06 |
| 6703850 | Method of inspecting circuit pattern and inspecting instrument | Mari Nozoe, Hiroyuki Shinada, Kenji Watanabe, Keiichi Saiki, Hiroshi Morioka +2 more | 2004-03-09 |