Issued Patents 2004
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6794663 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Kaoru Umemura, Eiichi Seya, Mitsuo Tokuda +3 more | 2004-09-21 |
| 6781125 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2004-08-24 |
| 6734687 | Apparatus for detecting defect in device and method of detecting defect | Tohru Ishitani, Aritoshi Sugimoto, Isamu Sekihara, Kaoru Umemura, Satoshi Tomimatsu +1 more | 2004-05-11 |
| 6717156 | Beam as well as method and equipment for specimen fabrication | Masakazu Sugaya, Hiroyasu Shichi, Muneyuki Fukuda, Kaoru Umemura | 2004-04-06 |