Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6822245 | Ion beam apparatus and sample processing method | Hiroyuki Muto, Yuichi Madokoro | 2004-11-23 |
| 6794663 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Hidemi Koike, Kaoru Umemura, Eiichi Seya, Mitsuo Tokuda +3 more | 2004-09-21 |
| 6734687 | Apparatus for detecting defect in device and method of detecting defect | Hidemi Koike, Aritoshi Sugimoto, Isamu Sekihara, Kaoru Umemura, Satoshi Tomimatsu +1 more | 2004-05-11 |